Sensor test apparatus

ABSTRACT

A sensor test apparatus having excellent versatility is provided. The sensor test apparatus includes a first application unit  40  including a first application device including a socket to which the sensor is electrically connected, and a pressure chamber  43  which applies pressure to the sensor, a test unit which tests the sensor  90  via the socket, a conveying robot which conveys the sensor into and out of the first application unit  40 , and an apparatus main body which houses the first application unit  40 , the test unit  35  and the conveying robot, and the apparatus main body has an opening which allows the first application unit  40  to be inserted into the apparatus main body and removed from the apparatus main body to an outside.

TECHNICAL FIELD

The present invention relates to a sensor test apparatus which tests a sensor.

The present application claims priority from Japanese Patent Application No. 2018-234115 filed on Dec. 14, 2018. The contents described and/or illustrated in the documents relevant to the Japanese Patent Application No. 2018-234115 will be incorporated herein by reference as a part of the description and/or drawings of the present application.

BACKGROUND ART

An evaluation device which evaluates a magneto-resistive effect element while applying a magnetic field to the magneto-resistive effect element and cooling the magneto-resistive effect element is known (for example, refer to Patent Document 1).

CITATION LIST Patent Document

-   PATENT DOCUMENT 1: JP 11-339232 A

SUMMARY OF THE INVENTION Problem to be Solved by the Invention

In the above-described evaluation apparatus, only the magneto-resistance effect element can be evaluated, and a sensor of a different type from the magneto-resistance effect element cannot be evaluated, and therefore, there is a problem that the versatility of the evaluation apparatus is inferior.

The problem to be solved by the invention is to provide a sensor test apparatus being excellent in versatility.

Means for Solving Problem

[1] A sensor test apparatus according to the present invention is a sensor test apparatus which tests a sensor which detects a physical quantity, the sensor test apparatus comprising: an application unit comprising at least one application device including a socket to which the sensor is electrically connected, and an application part which applies the physical quantity to the sensor; a test unit which tests the sensor via the socket; a conveying device which conveys the sensor into and out of the application unit; and an apparatus main body which houses the application unit, the test unit and the conveying device, in which the apparatus main body has a first opening which allows the application unit to be inserted into the apparatus main body and removed from the apparatus main body to an outside.

[2] In the above invention, the sensor test apparatus may include a unit connection part to which the application unit is detachably connected, and the unit connection part may be connectable to another application unit different from the application unit.

[3] In the above invention, the application unit may be a first application unit including a pressure application part which applies a pressure to the sensor, and the other application unit may be a second application unit including a differential pressure application part which applies two kinds of pressure to the sensor.

[4] In the above invention, the unit connection part may include: a first pipe connector to which the pressure application part of the first application unit is connected; a second pipe connector to which the differential pressure application part of the second application unit is connected; and a first electrical connector to which the socket of the first or second application unit is connected.

[5] In the above invention, the application unit may be a first application unit including a pressure application part which applies a pressure to the sensor, and the other application unit may be a third application unit including a magnetic field application part which applies a magnetic field to the sensor.

[6] In the above invention, the unit connection part may include: a first pipe connector to which the pressure application part of the first application unit is connected; a first electrical connector to which the socket of the first or third application unit is connected; and a second electrical connector to which the magnetic field application part of the third application unit is connected.

[7] In the above invention, the application unit may be a second application unit including a differential pressure application part which applies two kinds of pressure to the sensor, and the other application unit may be a third application unit including a magnetic field application part which applies a magnetic field to the sensor.

[8] In the above invention, the unit connection part may include: a second pipe connector to which the differential pressure application part of the second application unit is connected; a first electrical connector to which the socket of the second or third application unit is connected; and a second electrical connector to which the magnetic field application part of the third application unit is connected.

[9] In the above invention, the application device may include a temperature adjustment part which applies a thermal stress to the sensor to adjust the temperature of the sensor.

[10] In the above invention, the unit connection part may include at least one of a third pipe connector and a third electrical connector to which the temperature adjustment part is connected.

[11] In the above invention, the application device includes: a temperature adjustment part which applies a thermal stress to the sensor to adjust the temperature of the sensor; and a pusher which contacts the sensor and presses the sensor against the socket, and the temperature adjustment part may be disposed in the pusher.

[12] In the above invention, the application unit may comprise a plurality of the application devices.

[13] In the above invention, the first opening may allow the application unit to be removed from the apparatus main body in a first direction.

[14] In the above invention, the apparatus main body may include a slide mechanism which slidably holds the application unit in the first direction.

[15] In the above invention, the apparatus main body may have a second opening which allow the conveying device to be removed to the outside in a second direction opposite to the first direction, a third opening through which the sensor is fed to a first position in the sensor test apparatus, and a fourth opening through which the sensor is ejected from a second position in the sensor test apparatus, and the conveying device may move the untested sensor from the first position to the application unit and move the tested sensor from the application unit to the second position.

[16] In the above invention, in plan view, the first position, the application unit and the second position may be arranged in a substantially U-shape around the conveying device, the third opening may be opened in a third direction substantially orthogonal to the first direction and substantially orthogonal to the second direction, and the fourth opening may be opened in a fourth direction opposite to the third direction.

[17] In the above invention, the sensor test apparatus may comprise: a preheat part which is disposed between the first position and the application unit which applies a thermal stress to the sensor before being conveyed into the application unit; and a heat removal part which is disposed between the application unit and the second position and which removes a thermal stress from the sensor after being conveyed out of the application unit, and the conveying device may move the untested sensor from the first position to the preheat part, move the untested sensor from the preheat part to the application unit, move the tested sensor from the application unit to the heat removal part, and move the tested sensor from the heat removal part to the second position.

[18] In the above invention, the application unit may be interchangeable with the other application unit different from the application unit through the first opening.

Effect of the Invention

According to the present invention, since the apparatus main body of the sensor test apparatus has the first opening which allows the application unit to be removed, the application unit can be easily replaced with another application unit which tests a different type of a sensor, and therefore a sensor test apparatus excellent in versatility can be provided.

BRIEF DESCRIPTION OF DRAWING(S)

FIG. 1 is a perspective view showing a sensor test system in an embodiment of the present invention.

FIG. 2(a) is a plan view showing the pressure sensor that is the test object of the sensor test system in the embodiment of the present invention, and FIG. 2(b) is a plan view showing a modification of the pressure sensor that is the test object of the sensor test system in the embodiment of the present invention.

FIG. 3 is a diagram showing the internal layout of a loader in an embodiment of the present invention, and is a cross-sectional view taken along the III-III line in FIG. 1 .

FIG. 4 is a diagram showing the internal layout of an unloader in an embodiment of the present invention, and is a cross-sectional view taken along the IV-IV line of FIG. 1 .

FIG. 5 is a perspective view showing a test cell in an embodiment of the present invention.

FIG. 6 is a view showing the internal layout of a test cell in an embodiment of the present invention, and is a cross-sectional view taken along the VI-VI line of FIG. 1 .

FIG. 7 is a perspective view of a test cell seen from the back side in an embodiment of the present invention.

FIG. 8 is a front view showing a conveying robot in an embodiment of the present invention.

FIG. 9 is a plan view showing a conveying robot in an embodiment of the present invention.

FIG. 10 is a perspective view showing a first application unit in an embodiment of the present invention

FIG. 11 is a cross-sectional view of a first application unit in an embodiment of the present invention, and is a cross-sectional view taken along the XI-XI line of FIG. 10 .

FIG. 12 is a back view showing a connection part of the first application unit in the embodiment of the present invention, and is a view seen in the XII arrow direction of FIG. 10 .

FIG. 13 is a cross-sectional view showing a pressure chamber in an embodiment of the present invention.

FIG. 14 is a plan view showing the base portion of the pressure chamber in the embodiment of the present invention, and is a view seen in the XIV arrow direction of FIG. 12 .

FIG. 15 is a block diagram showing a control system of a test cell in an embodiment of the present invention.

FIG. 16 is a perspective view showing the inside of the base of the test cell in the embodiment of the present invention.

FIG. 17 is a diagram showing a unit connection part in an embodiment of the present invention, and is a view seen in the XVII arrow direction of FIG. 7 .

FIG. 18 is a diagram showing a modification of the unit connection part in an embodiment of the present invention.

FIG. 19 is a piping circuit diagram of a temperature adjustment unit in an embodiment of the present invention.

FIGS. 20(a) to 20(c) are a cross-sectional view showing the operation of the first application unit in the embodiment of the present invention (No. 1 to No. 3).

FIGS. 21(a) to 21(c) are cross-sectional views (No. 4 to No. 6) showing the operation of the first application unit in the embodiment of the present invention.

FIG. 22 is a cross-sectional view showing a pressure chamber in an embodiment of the present invention, and is an enlarged view of the XXII portion of FIG. 21(c).

FIG. 23 is a perspective view showing a second application unit in an embodiment of the present invention.

FIG. 24 is a back view showing the connection portion of the second application unit in an embodiment of the present invention, and is a view seen in the XXIV arrow direction of FIG. 23 .

FIG. 25 is a cross-sectional view showing the second application device of the second application unit in an embodiment of the present invention.

FIG. 26 is a perspective view showing a third application unit in an embodiment of the present invention.

FIG. 27 is a back view showing the connection portion of the third application unit in an embodiment of the present invention, and is a view seen in the XXVII arrow direction of FIG. 26 .

FIG. 28 is a cross-sectional view showing the third application device of the third application unit in an embodiment of the present invention.

MODE(S) FOR CARRYING OUT THE INVENTION

Hereinafter, an embodiment of the present invention will be described with reference to the drawings.

FIG. 1 is a perspective view showing a sensor test line in the present embodiment, FIG. 2(a) is a plan view showing a pressure sensor that is the test object of the sensor test system in the present embodiment, and FIG. 2(b) is a plan view showing a modification of the pressure sensor that is the test object of the sensor test system in the present embodiment.

As shown in FIG. 1 , the sensor test system 1 in the present embodiment is a sensor test line including a test apparatus group 20 configured by connecting a plurality of (four in this example) test cells 30 (30A to 30D) for testing a sensor 90. The test cell 30 in the present embodiment corresponds to an example of the “sensor test apparatus” in the present invention. The number of the test cells 30 constituting the test apparatus group 20 is not particularly limited, and can be set in accordance with the number of types of tests performed by the sensor test system 1 and the like.

The sensor 90 which is a test object of the sensor test system 1 is a pressure sensor that detects (measures) pressure and outputs an electrical signal according to the detection result (measurement result). As shown in FIG. 2(a), the sensor 90 is a sensor device of a type in which an individualized sensor chip (die) 902 is mounted on a wiring board 901. Contactors of a socket 445 of the first application unit 40 described later contact terminals 903 provided on the wiring board 901.

As shown in FIG. 2(b), the sensor 90′ which is a test object of the sensor test system 1 may be a sensor device of a type in which a wiring board 901 on which a sensor chip 902 is mounted is packaged with a resin material and leads 905 protrude from the package 904. In this case, the contactors of socket 445 contact the leads 905.

The test object of the sensor test system 1 may be a sensor other than a pressure sensor. For example, a differential pressure sensor or a magnetic sensor may be a test object of the sensor test system 1. Alternatively, a sensor for detecting a physical quantity other than pressure or magnetism may be a test object of the sensor test system 1.

Each of the test cells 30 is a device that determines whether or not the sensor 90 is defective on the basis of an electric signal output from the sensor 90 in a state where the temperature of the sensor 90 is adjusted to a predetermined temperature and a predetermined pressure is applied to the sensor 90. Although not particularly limited, in the sensor test system 1, it is possible to perform multiple type of tests (four types in this example) with respect to one sensor 90 by passing the sensor 90 through a plurality of test cells 30A to 30D.

As shown in FIG. 1 , the sensor test system 1 includes a loader 10 that carries an untested sensor 90 into the test apparatus group 20, and an unloader 80 that carries the tested sensor 90 out of the test apparatus group 20, and can automatically carry the sensor 90 into/out of the test apparatus group 20.

FIG. 3 is a diagram showing an internal layout of the loader in the present embodiment, and is a cross-sectional view taken along the line of FIG. 1 .

The loader 10 in the present embodiment is a loading device for carrying an untested sensor 90 into the test apparatus group 20, and is connected to a test cell 30A located at the leading end (left end in FIG. 1 ) of the test apparatus group 20. As shown in FIG. 3 , the loader 10 includes a transfer device 11 and a moving device 12.

The transfer device 11 is a pick-and-place device that conveys the sensor 90, and includes an suction head 111 that can hold the sensor 90 by suction and can move up and down in the Z direction, and a rail 112 that moves the suction head 111 on the XY plane. The moving device 12 includes a rail 121 provided along the X direction, and a plate 122 reciprocally movable on the rail 121. A plurality of concave accommodating portions 123 capable of accommodating the sensors 90 are formed on the upper surface of the plate 122.

A part of the moving device 12 and the transfer device 11 are accommodated in a cover 13 of the loader 10, and two openings 13 a and 13 b are formed in the cover 13. The remainder of the moving device 12 extends into the test cell 30A through one opening 13 b.

The tray 14 is carried into the lower side of the transfer device 11 through the other opening 13 a. Transfer device 11 picks up the sensor 90 from this tray 14 and places it in the accommodation portion 123 of the plate 122 located in the loader 10. The moving device 12 moves the plate 122 into the test cell 30A through the opening 13 b, and carries the untested sensor 90 into the test cell 30A.

The configuration of the loader 10 is not particularly limited to the above-described configuration. For example, instead of the pick-and-place device, an articulated robot arm may be used as the transfer device 11. Alternatively, a parts feeder may be used instead of the transfer device 11. The plurality of trays 14 may be carried into the loader 10 in a state of being accommodated in a magazine.

FIG. 4 is a diagram showing an internal layout of the unloader in the present embodiment, and is a cross-sectional view taken along the Iv-Iv line of FIG. 1 .

The unloader 80 in the present embodiment is a discharge device for discharging the tested sensor 90 from the test apparatus group 20, and is connected to the test cell 30D located at the rear end (right end in FIG. 1 ) of the test apparatus group 20. As shown in FIG. 4 , the unloader 80 includes a moving device 81 and a transfer device 82.

The moving device 81 is the same device as the moving device 12 of the loader 10 described above, and includes a rail 811 and a plate 812, and a plurality of accommodation portions 813 are formed on the upper surface of the plate 812. The transfer device 82 is the same device as the transfer device 11 of the loader 10 described above, and is a pick-and-place device including a suction head 821 and a rail 822.

A part of the moving device 81 and the transfer device 82 are accommodated in a cover 83 of the unloader 80, and two openings 83 a and 83 b are formed in the cover 83. The remainder of the transfer device 81 extends into the test cell 30D through one opening 83 a.

The moving device 81 moves the plate 812 from the test cell 30D into the unloader 80 and ejects the tested sensor 90 from the test cell 30D. Then, the transfer device 82 picks up the sensor 90 from the plate 812 located in the unloader 80, and places it on the trays 84 located below the transfer device 82. At this time, the transfer device 82 may place the sensor 90 on the tray 84 while classifying the sensors 90 on the basis of the test results of the respective test cells 30. The tray 84 is carried out of the unloader 80 through the other opening 83 b of the cover 83.

The configuration of the unloader 80 is not particularly limited to the above-described configuration. For example, an articulated robot arm may be used as the transfer device 82 instead of the pick-and-place device. Alternatively, a parts feeder may be used instead of the transfer device 82. The plurality of trays 84 may be carried out of the unloader 80 in a state of being accommodated in a magazine.

FIG. 5 is a perspective view showing the test cell in the present embodiment, FIG. 6 is a view showing the internal layout of the test cell in the present embodiment, and FIG. 7 is a perspective view showing the test cell seen from the back side in the present embodiment. FIGS. 8 and 9 are a front view and a plan view showing the conveying robot in the present embodiment.

The test apparatus group 20 in the present embodiment includes a plurality of test cells 30 that respectively execute a test of the sensor 90, and a moving device 70 that transfers the sensor 90 between mutually adjacent test cells 30.

As shown in FIG. 6 , the moving device 70 is the same device as the moving device 12 of the loader 10 described above, and includes a rail 71 and a plate 72, and a plurality of accommodating portions 73 are formed on the upper surface of the plate 72.

As shown in FIGS. 5 and 6 , each of the test cells 30 includes a preheat part 31, a plurality of (two in this example) first application units 40, a heat removal part 32, and a conveying robot 33. Since the test cell 30 includes the plurality of first application units 40, throughput in the test cell 30 can be improved.

The number of the first application units 40 included in the test cell 30 is not particularly limited, and the test cell 30 may include only one first application unit 40, or may include three or more first application units 40. The test cell 30 may not include the preheat part 31 and the heat removal part 32.

The test cell 30 includes an apparatus main body 301 that accommodates a preheat part 31, first application units 40, a heat removal part 32 and the conveying robot 33. The apparatus main body 301 includes a base 302 and a cover 305.

The base 302 includes a frame 303 and a base plate 304 supported by the frame 303. The base 302 has a concave portion 302 a recessed in the +Y direction in plan view, and has a substantially U-shaped planar shape. The base 302 has an opening 302 b formed by the concave portion 302 a, and the opening 302 b opens in the −Y direction.

The cover 305 is provided on the base 302 and has a substantially cubic shape including the entire surface of the base plate 304 including the concave portion 302 a. Openings 306 a and 306 b are formed in the X direction side surfaces 305 a and 305 b of the cover 305 respectively. The opening 306 a opens in the −X direction, and the opening 306 b opens in the +X direction.

An opening 306 c that opens in the −Y direction is formed in the −Y direction side surface 305 c of the cover 305. The opening 306 c is located above the opening 302 b of the base 302, and the openings 302 b and 306 c substantially coincide with each other in the Z direction. Further, two openings 306 d that open in the −Y direction are formed in the +Y direction side surface 305 d of the cover 305.

The opening 306 d in the present embodiment corresponds to an example of the “first opening” in the present invention, and the opening 302 b and 306 c in the present embodiment corresponds to an example of the “second opening” in the present invention. The opening 306 a in the present embodiment corresponds to an example of the “third opening” in the present invention, and the opening 306 b in the present embodiment corresponds to an example of the “fourth opening” in the present invention.

The −Y direction in the present embodiment corresponds to an example of the first direction in the present invention, the +Y direction in the present embodiment corresponds to an example of the second direction in the present invention, the −X direction in the present embodiment corresponds to an example of the third direction in the present invention, and the +X direction in the present embodiment corresponds to an example of the fourth direction in the present invention.

As described above, in the present embodiment, the openings 306 a to 306 d are opened in four directions. Thus, as shown in FIG. 1 , it is possible to employ a layout in which a plurality of test cells 30 are connected in a line.

The preheat part 31, the first application units 40, and the heat removal part 32 are provided on the base plate 304 of the base 302, and are disposed in the apparatus main body 301. The conveying robot 33 also enters the concave portion 302 a of the base 302 via the openings 302 b and 306 c of the apparatus main body 301, and is disposed in the apparatus main body 301. The conveying robot 33 can be moved into and out of the apparatus main body 301 in the Y direction through the openings 302 b and 306 c, and the test cell 30 is excellent in the maintainability.

In the case where the test cell 30 is the test cell 30A at the leading end (left end in FIG. 1 ), the moving device 12 of the loader 10 described above enters the test cell 30A through the opening 306 a. A part of the moving device 70 is located on the base plate 304 of the test cell 30A, and the remainder of the moving device 70 extends toward the rear end side test cell 30B through the opening 306 b.

In this case, the portion of the moving device 12 located on the base plate 304 of the test cell 30A corresponds to an example of the “first position” in the present invention. The portion of the moving device 70 located on the base plate 304 of the test cell 30A corresponds to an example of the “second position” in the present invention.

On the other hand, in the case where the test cell 30 is the test cell 30D at the rear end (right end in FIG. 1 ), the moving device 70 protruding from the leading end side test cell 30C enters the test cell 30D through the opening 306 a. The moving device 81 of the unloader 80 enters the test cell 30 D through the opening 306 b.

In this case, the portion of the moving device 70 located on the base plate 304 of the test cell 30D corresponds to an example of the “first position” in the present invention. The portion of the moving device 81 located on the base plate 304 of the test cell 30D corresponds to an example of the “second position” in the present invention.

Further, in the case where the test cell 30 is an intermediate test cell 30B (test cell 30C) other than the test cells 30A and 30D, the moving device 70 protruding from the leading end side test cell 30A (test cell 30B) enters the test cell 30B (test cell 30C) through the opening 306 a. A part of another moving device 70 is located on the base plate 304 of the test cell 30B (test cell 30C), and the remaining part of the moving device 70 extends toward the rear end side test cell 30C (test cell 30D) through the opening 306 b.

In this case, the portion of the leading end side moving device 70 located on the base plate 304 of the test cell 30B (test cell 30C) corresponds to an example of the “first position” in the present invention. The portion of the rear end side moving device 70 located on the base plate 304 of the test cell 30B (test cell 30C) corresponds to an example of the “second position” in the present invention.

In plan view, the moving device 12 (moving device 70), the preheat part 31, the first application units 40, the heat removal part 32 and the moving device 70 (moving device 81) are arranged in a substantially U-shape so as to surround the conveying robot 33.

More specifically, the preheat part 31 is disposed between the moving device 12 (moving device 70) that is in the apparatus main body 301 and the first application unit 40. The heat removal part 42 is disposed between the first application unit 40 and the moving device 70 (moving device 81) that is in the test cell 30. The leading end side moving device 12 (moving device 70) and the rear end side moving device 70 (moving device 81) face each other via the concave portion 302 a of the base 302. Similarly, the preheat part 31 and the heat removal part 32 also face each other via the concave portion 302 a. By employing such a substantially U-shaped layout, space saving of the test cell 30 can be achieved.

The layout in the apparatus main body 301 is not limited to a substantially U-shape. For example, the moving device 12 (moving device 70), the preheat part 31, the first application unit 40, the heat removal part 32 and the moving device 70 (moving device 81) may be arranged linearly in the apparatus main body 301.

As shown in FIG. 7 , the two openings 306 d are arranged on the side wall 305 d so as to correspond to the two first application units 40. The first application unit 40 can be inserted into the apparatus main body 301 and removed from the apparatus main body 301 to the outside along the Y direction through the opening 306 d. Each opening 306 d is provided with a door 305 e hingeably attached to the side wall 305 d, although this door 305 e may be omitted. The number of the openings 306 d is not particularly limited to the above, and is set according to the number of the first application units 40 included in the test cell 30.

A pair of slide rails 307 are provided along the Y direction inside each opening 306 d. The pair of slide rails 307 has a substantially U-shaped cross section respectively, and are disposed so as to face the openings 307 a. The slide rails 307 are supported by, for example, the base plate 304 of the base 302.

Both ends of the support plate 401 of the first application unit 40 are inserted into the openings 307 a, thereby the slide rail 307 holds the first application unit 40 slidably in the Y direction. The slide rails 307 in the present embodiment correspond to an example of the “slide mechanism” in the present invention. The configuration of the slide mechanism is not particularly limited to the above as long as the first application unit 40 can be slidably held.

A unit connection part 308 is provided at terminal ends of the slide rails 307 in the apparatus main body 301. Details of the unit connecting part 308 will be described later. The unit connecting part 308 is supported by, for example, the base plate 304 of the base 302 of the apparatus main body 301.

In the present embodiment, since the opening 306 d is provided in the apparatus main body 301, the first application unit 40 can be easily taken out from the apparatus main body 301, so that the first application unit 40 can be easily replaced with other application units 50 and 60 (to be described later) for testing different types of sensors 91 and 92. Further, since the opening 306 d is provided in the apparatus main body 301, the test cell 30 is excellent in maintainability.

The position at which the opening 306 d is formed is not particularly limited. For example, the opening 306 d may be formed in the side surface 305 a (side surface 305 b) of the cover 305, and the first application unit 40 may be moved in and out in the X direction. Alternatively, the opening 306 d may be formed in the upper surface of the cover 305, and the first application unit 40 may be moved in and out in the Z direction. Alternatively, the first application unit 40 may be moved horizontally after being lowered, so that the first application unit 40 is taken out from the apparatus main body 301.

As shown in FIGS. 5 and 6 , the preheat part 31 includes a plate 311 having a plurality of recessed accommodation portions 312 capable of accommodating the sensors 90 respectively. The plate 311 is connected to a heating/cooling device (not shown), and the temperature of the sensor 90 before being supplied to the first application unit 40 can be brought close to a predetermined temperature in advance. Thereby, it is possible to shorten the time required for the temperature of the sensor 90 to reach the predetermined temperature in the first application unit 40

The heat removal part 32 also includes a plate 321 having a plurality of recessed accommodation portions 322 capable of accommodating the sensors 90. The plate 321 is connected to a heating/cooling device (not shown), and the temperature of the sensor 90 after being discharged from the first application unit 40 can be brought close to room temperature. Thereby, it is possible to shorten the heat removal period of the sensor 90 after the test in the first application unit 40, and to restrain condensation from occurring on the sensor 90 after the test.

The configuration of the preheat part 31 is not particularly limited to the above. For example, the preheat part 31 may blow warm air or cold air to the untested sensor 90 to heat/cool the sensor 90. Similarly, the configuration of the heat removal part 32 is not particularly limited to the above. For example, the heat removal part 32 may blow warm air or cold air to the tested sensor 90 to heat/cool the sensor 90.

As shown in FIGS. 8 and 9 , the conveying robot 33 is a double-armed scalar robot having two articulated arms 332 and 336. The conveying robot 33 carries the untested sensor 90 into the first application unit 40, and carries the tested sensor 90 out of the first application unit 40. The conveying robot 33 in the present embodiment corresponds to an example of the “conveying device” in the present invention.

The conveying robot 33 includes a base portion 331, a first articulated arm 332, and a second articulated arm 336. The first and second articulated arms 332 and 336 are supported by the base portion 331, and are rotatable about the first rotation shaft RA₁. That is, the first and second articulated arms 332 and 336 share the first rotation shaft RA₁.

The first articulated arm 332 includes a first arm 333, a second arm 334, and a first suction head 335. The first arm 333 is supported by the base portion 331 and is rotatable about the first rotation shaft RA₁ as described above. The second arm 334 is supported by the first arm 333 and is rotatable about the second rotation shaft RA₂. The first suction head 335 is supported by the second arm 334 and is rotatable about the third rotation shaft RA₃. The first suction head 335 is held by the second arm 334 so as to be able to move up and down in the Z direction, and has a suction pad capable of holding the sensor 90 by suction.

Similarly to the first articulated arm 331, the second articulated arm 336 also includes a third arm 337, a fourth arm 338, and a second suction head 339. The third arm 337 is supported by the base portion 331 and is rotatable about the first rotation shaft RA₁ as described above. The fourth arm 338 is supported by the third arm 337 and is rotatable about the fourth rotation shaft RA₄. The second suction head 339 is supported by the fourth arm 338 and is rotatable about the fifth rotation shaft RA₅. The second suction head 339 is held by the fourth arm 338 so as to be able to move up and down in the Z direction, and has a suction pad capable of holding the sensor 90 by suction.

In the present embodiment, space saving of the test cell 30 can be achieved by using such a double-armed scalar robot as the conveying robot 33. The configuration of the first and second articulated arms 331 and 336 (e.g., the degree of freedom and the length of each arm) is not particularly limited to the above. The configuration of the first articulated arm 331 and the configuration of the second articulated arm 336 may be different from each other. Alternatively, another type of robot other than the double-armed scalar robot may be used as the conveying robot 33. Alternatively, instead of the conveying robot 33, another conveying device such as a pick-and-place device may be used.

As shown in FIGS. 5 and 6 , when an untested sensor 90 is carried into the test cell 30 from the loader 10 (previous test cell 30) by the moving device 12 (moving device 70), the conveying robot 33 moves the sensor 90 from the moving device 12 (moving device 70) to the preheat part 31, and further moves the sensor 90 from the preheat part 31 to the first application unit 40. When the test of the sensor 90 is completed in the first application unit 40, the conveying robot 33 moves the tested sensor 90 from the first application unit 40 to the heat removal part 32, and further moves the sensor 90 from the heat removal part 32 to the moving device 70 (moving device 81). The moving device 70 (moving device 81) moves the sensor 90 to the next test cell 30 (unloader 80).

At this time, in the present embodiment, the first articulated arm 332 of the conveying robot 33 is in charge of supplying the sensor 90 to the first application unit 40. On the other hand, the second articulated arm 336 is in charge of discharging the sensor 90 from the first application unit 40.

Specifically, the first articulated arm 332 is in charge of the movement from the moving device 12 (moving device 70) to the preheat part 31 and the movement from the preheat part 31 to the first application unit 40. On the other hand, the second articulated arm 336 is in charge of the movement from the first application unit 40 to the heat removal part 32 and the movement from the heat removal part 32 to the moving device 70 (moving device 81). The first articulated arm 332 supplies the untested sensors 90 to both first application units 40, and the second articulated arm 336 discharges the tested sensors 90 from both first application units 40.

FIGS. 10 and 11 are a perspective view and a cross-sectional view showing a first application unit in the present embodiment, FIG. 12 is a back view showing a connection part of the first application unit in the present embodiment, FIG. 13 is a cross-sectional view showing a pressure chamber in the present embodiment, and FIG. 14 is a plan view showing a base portion of the pressure chamber in the present embodiment.

As shown in FIGS. 10 and 11 , the first application unit 40 includes a dry chamber 41 and a plurality of (four in this example) first application devices 42. In the present embodiment, although the two first application units 40 included in the respective test cells 30 have the same structure, the present invention is not particularly limited thereto.

In the present embodiment, four first application devices 42 are accommodated in the dry chamber 41, and one first application device 42 corresponds to one sensor 90. Therefore, in the first application unit 40 of the present embodiment, it is possible to test four sensors 90 at the same time. The number of the first application devices 42 included in the first application unit 40 is not particularly limited, and can be arbitrarily determined in accordance with throughput and the like required for the test cell 20.

The dry chamber 41 includes a box-shaped housing 411 having an opening 411 a, and a lid 412 covering the opening 441 a. Dry air having a low dew point temperature is filled in the dry chamber 41 to suppress the occurrence of condensation on the sensor 90.

The dry chamber 41 is supported by a support plate 401. As described above, both ends of the support plate 401 are inserted into the slide rails 307 of the apparatus main body 301, thereby the first application unit 40 is slidably held by the slide rails 307. A handle 402 is attached to the front surface of the housing 41 to facilitate the work of taking the first application unit 40 in and out of the apparatus main body 301.

Four windows 412 a are formed in the lid 412 so as to correspond to the four first application devices 42 respectively. Four shutters 413 is provided in the lid 412 so as to correspond to the four windows 412 a. The shutter 413 is reciprocally movable in the Y direction by the actuator 414, and the window 412 a of the lid 412 is opened and closed by the shutter 413 when the sensor 90 is carried in and out of the first application unit 40. As a specific example of the actuator 414, for example, an air cylinder can be exemplified.

In the present embodiment, as shown in FIG. 12 , a connection portion 403 is provided on the back surface 411 b of the housing 411 of the dry chamber 41. The connection portion 403 includes various connectors 403 a to 403 d.

The electrical connector 403 a is an electrical connector for testing and is connected to the socket 445. The electrical connector 403 a is provided so as to correspond to the electrical connector 309 a (see FIG. 17 ) of the unit connecting part 308 of the apparatus main body 301, and is fitted to the electrical connector 309 a.

The electrical connector 403 b is an electrical connector for actuator control. The electrical connector 403 b is provided so as to correspond to the electrical connector 309 b (see FIG. 17 ) of the unit connecting part 308 of the apparatus main body 301, and is fitted to the electrical connector 309 b.

The pipe connector 403 c is a pipe connector for temperature adjustment. The pipe connector 403 c is provided so as to correspond to the pipe connector 309 c (see FIG. 17 ) of the unit connecting part 308 of the apparatus main body 301, and is fitted to the pipe connector 309 c.

The pipe connector 403 d is a pipe connector for pressure adjustment. The pipe connector 403 d is provided so as to correspond to the pipe connector 309 d (refer to FIG. 17 ) of the unit connecting part 308 of the apparatus main body 301, and is fitted to the pipe connector 309 d.

The configuration of the application unit is not particularly limited to the above. For example, the application unit may not comprise a dry chamber. In this case, the first application unit may be configured by simply providing a plurality of first application devices 42 on the support plate 401 and by standing the holding members holding the connectors 403 a to 403 d on the support plate 401.

Each of the first application devices 42 is a unit that applies a thermal stress to the sensor 90 supplied by the conveying robot 33 and applies a pressure to the sensor 90. As shown in FIGS. 10 and 11 , the first application device 42 includes a pressure chamber 43 and a pressing mechanism 48. In the present embodiment, the four first application devices 42 included in the respective first application units 40 have the same structure, but the present invention is not particularly limited thereto.

As shown in FIGS. 13 and 14 , the pressure chamber 43 has a base portion 44 and a head portion 45. The base portion 44 is fixed to the bottom surface of the housing 411 so as to face the window 412 a of the lid 412 of the dry chamber 41. A circular concave portion 441 is opened on the upper surface of the base portion 44, and an O-ring 442 is provided so as to surround the opening of the concave portion 441.

A pipe 444 a is connected to a side surface of the base portion 44. The pipe 444 a communicates with the inside of the concave portion 441 and is connected to the pipe connector 403 d. The pipe connector 403 d is connected to the pressure adjustment unit 36 via the pipe connector 309 d of the unit connecting part 308 provided in the apparatus main body 301, as shown in FIG. 15 .

A socket 445 is provided at the center of the inside of the concave portion 441. Although not shown in particular, the socket 445 has contactors that contact the terminals 903 of the sensor 90. Examples of such contactors include pogo pins, anisotropic conductive rubber, and the like.

A cable 446 is connected to a side surface of the base portion 44. The socket 445 is electrically connected to the test unit 35 via the cable 446. Specifically, the cable 446 is electrically connected to the socket 445, and the electrical connector 403 a is connected to an end portion of the cable 446. The electrical connector 403 a is electrically connected to the test unit 35 via the electrical connector 309 a of the unit connecting part 308 provided in the apparatus main body 301 (refer to FIG. 15 ).

A heat sink 443 is formed inside the base portion 44. Although not shown in particular, the heat sink 443 has a bellows-shaped flow path formed inside the base portion 44, fins protruding from the inner wall of the base portion 44, or the like, and can efficiently exchange heat with the refrigerant/hot medium supplied from the temperature adjustment unit 37. The heat sink 443 is provided directly below the socket 445, and can heat/cool the sensor 90 through the socket 445.

Pipes 444 b to 444 d are connected to the side surface of the base portion 44. These pipes 444 b to 444 d communicate with the heat sink 443 and are connected to the pipe connectors 403 c respectively. The pipe connector 403 c is connected to the temperature adjustment unit 37 via the pipe connector 309 c of the unit connecting part 308 provided in the apparatus main body 301 (refer to FIG. 15 ).

The head portion 45 of the pressure chamber 43 includes a pusher 46 and a holding plate 47. As shown in FIG. 11 , the head portion 45 is provided in the dry chamber 41 so as to be reciprocally movable in the Y direction by an actuator 472 (to be described later), and can reciprocate between a position above the base portion 44 (refer to FIG. 21(b)) and a position retreated from above the base portion 44 (see FIG. 20(a)).

As shown in FIG. 13 , the pusher 46 has a convex portion 461 protruding downward, and the convex portion 461 contacts the sensor 90 to press the sensor 90 against the socket 445.

A heat sink 462 is provided inside the pusher 46. Similarly to the heat sink 443 of the base portion 44 described above, the heat sink 462 has a bellows-shaped flow path formed inside the pusher 46, fins protruding from the inner wall of the pusher 46, or the like, and can efficiently exchange heat with the refrigerant/hot medium supplied from the temperature adjustment unit 37.

The heat sink 462 is formed also inside the convex portion 461, and can heat/cool the sensor 90. Pipes 463 a to 463 c are connected to the side surface of the head portion 45. These pipes 463 a to 463 c communicate with the heat sink 462 and are connected to the pipe connector 403 c respectively. The pipe connector 403 c is connected to the temperature adjustment unit 37 via the pipe connector 309 c of the unit connecting part 308 provided in the apparatus main body 301 (refer to FIG. 15 ).

In the present embodiment, both the base portion 44 and the head portion 45 have the heat sinks 443 and 462, but this is not particularly limited. For example, one of the base portion 44 or the head portion 45 may have a heat sink, and the other of the head portion 45 or the base portion 44 may have a temperature adjustment means other than the heat sink. As an example of the temperature adjustment means other than the heat sink, for example, a heater, a Peltier element, or the like can be exemplified. Alternatively, only one of the base portion 44 or the head portion 45 may have a temperature adjustment means, and the other of the head portion 45 or the base portion 44 may not have a temperature adjustment means. When at least one of the base portion 44 and the head portion 45 includes a heater or a Peltier element, the connection portion 403 includes an electrical connector for temperature adjustment.

A pair of cam followers 464 are rotatably mounted on the upper portion of the pusher 46. As the cam follower 464 rolls along the cam groove 482 of the pressing mechanism 48 (to be described later), the pusher 46 is lowered.

Further, the pusher 46 is inserted into an opening 471 of the holding plate 47, and is movably held by the holding plate 47 via a stopper 465 and a coil spring 466. The stopper 465 is inserted into the through hole of the holding plate 47 and fixed to the pusher 46. The coil spring 466 is interposed between the stopper 465 and the holding plate 47 in a compressed state, and the pusher 46 is urged upward by the coil spring 466.

As shown in FIG. 11 , an actuator 472 fixed to the dry chamber 41 is connected to the holding plate 47. The actuator 472 allows the head portion 45 to reciprocate in the Y direction. As a specific example of the actuator 472, for example, an air cylinder can be exemplified. The actuator 472 is electrically connected to the electrical connector 403 b of the connection portion 403.

The pressing mechanism 48 is provided in the dry chamber 41 so as to face the head portion 45 with the base portion 44 interposed therebetween. The pressing mechanism 48 includes a cam plate 481 and an actuator 484.

A cam groove 482 into which the cam follower 464 of the pusher 46 is inserted is formed in the cam plate 481. As the cam follower 464 rolls along the inclined surface 483 of the cam groove 482, the pusher 46 descends relative to the holding plate 47.

An actuator 484 fixed to the dry chamber 41 is connected to the cam plate 481. The actuator 484 allows the cam plate 481 to reciprocate in the Y direction. As a specific example of the actuator 484, for example, an air cylinder can be exemplified. Similarly to the actuator 472 described above, the actuator 484 is electrically connected to the electrical connector 403 b of the connection portion 403.

The pressure chamber 43 in the present embodiment corresponds to an example of the “pressure application part” in the present invention, and the heat sink 462 formed in the head portion 45 in the present embodiment corresponds to an example of the “temperature adjustment part” in the present invention.

The configuration of the application device is not particularly limited to the above configuration as long as the application device includes a socket to which the sensor is electrically connected, a mechanism for applying a thermal stress to the sensor, and a mechanism for applying pressure to the sensor.

The configuration of the moving mechanism for moving the pusher 46 relative to the socket 445 is not particularly limited to the above. For example, instead of the actuator 472 and the pressing mechanism 48, a ball screw and a motor may be used to configure the moving mechanism. Alternatively, a pick-and-place device, a robot having an articulated arm, or the like may be used as a moving mechanism.

FIG. 15 is a block diagram showing the control system of the test cell in the present embodiment, FIG. 16 is a perspective view showing the inside of the base of the test cell in the present embodiment, FIG. 17 is a view showing the unit connection part in the present embodiment, FIG. 18 is a view showing a modification of the unit connection part in the present embodiment, and FIG. 19 is a piping circuit diagram of the temperature adjustment unit in the present embodiment.

As shown in FIG. 15 , each test cell 30 includes a control unit 34, a test unit 35, a pressure adjustment unit 36, a temperature adjustment unit 37, a differential pressure adjustment unit 38, and a magnetic field adjustment unit 39.

As shown in FIG. 16 , the control unit 34, the test unit 35, the pressure adjustment unit 36, the temperature adjustment unit 37, the differential pressure adjustment unit 38 and the magnetic field adjustment unit 39 are installed inside a frame 303 of a base 302 of an apparatus main body 301. In the present embodiment, the test unit 35 is disposed directly under the application unit 40 from the viewpoint of improving the test accuracy, but the present invention is not particularly limited thereto. For example, the pressure adjustment unit 36 may be arranged directly below the application unit 40, or the temperature adjustment unit 37 may be arranged directly below the application unit 40.

Further, in the present embodiment, the test cell 30 includes a unit connection part 308 to which the first application unit 40 is detachably connected. The second application unit 50 and the third application unit 60, which will be described later, can also be connected to the unit connection part 308. As described above, the unit connection part 308 is provided at the terminal ends of the slide rails 307 in the apparatus main body 301, and is disposed so as to face the first application unit 40.

As shown in FIG. 17 , the unit connection part 308 includes a board 308 a and various connectors 309 a to 309 f mounted on the board 308 a.

The electrical connector 309 a is a connector for testing and is connected to the test unit 35, and the electrical connector 403 a of the first application unit 40 is fitted to the electrical connector 309 a (see FIG. 15 ). An electrical connector 503 a (see FIG. 24 ) of the second application unit 50 described later can be fitted to the electrical connector 309 a, and an electrical connector 603 a (see FIG. 27 ) of the third application unit 60 described later can also be fitted to the electrical connector 309 a.

The electrical connector 309 b is a connector for an actuator control and is connected to the control unit 34, and the electrical connector 403 b of the first application unit 40 is fitted to the electrical connector 309 b (see FIG. 15 ). An electrical connector 503 b (see FIG. 24 ) of the second application unit 50 described later can be fitted to the electrical connector 309 b, and an electrical connector 603 b (see FIG. 27 ) of the third application unit 60 described later can also be fitted to the electrical connector 309 b.

The pipe connector 309 c is a connector for temperature adjustment and is connected to the temperature adjustment unit 37, and the pipe connector 403 c of the first application unit 40 is fitted to the pipe connector 309 c (see FIG. 15 ). A pipe connector 503 c (refer to FIG. 24 ) of the second application unit 50 described later can be fitted to the pipe connector 309 c, and a pipe connector 603 c (see FIG. 27 ) of the third application unit 60 described later can also be fitted to the pipe connector 309 c.

The pipe connector 309 d is a connector for pressure adjustment and is connected to the pressure adjustment unit 36, and the pipe connector 403 d (see FIG. 15 ) of the first application unit 40 is fitted to the pipe connector 309 d.

The pipe connector 309 e is a connector for differential pressure adjustment and is connected to the differential pressure adjustment unit 38, and a pipe connector 503 e (refer to FIG. 24 ) of the second application unit 50 described later can be fitted to the pipe connector 309 e.

The electrical connector 309 f is a connector for magnetic field adjustment and is connected to the magnetic field adjustment unit 39, and a pipe connector 603 f (refer to FIG. 27 ) of the third application unit 60 described later can be fitted to the electrical connector 309 f.

When at least one of the base portion 44 and the head portion 45 of the first application unit 40 has a heater or a Peltier element and the connecting portion 403 has an electrical connector for temperature adjustment, as shown in FIG. 18 , the unit connecting part 308′ has an electrical connector 309 g. The electrical connector 309 g is connected to a controller for controlling the heater and the Peltier element, and an electrical connector for adjusting the temperature of the first application unit 40 can be fitted to the electrical connector 309 g.

The electrical connector 309 a in the present embodiment corresponds to an example of the first electrical connector in the present invention, the electrical connector 309 f in the present embodiment corresponds to an example of the second electrical connector in the present invention, and the electrical connector 309 g in the present embodiment corresponds to an example of the third electrical connector in the present invention.

The pipe connector 309 d in the present embodiment corresponds to an example of the first pipe connector in the present invention, the pipe connector 309 e in the present embodiment corresponds to an example of the second pipe connector in the present invention, and the pipe connector 309 c in the present embodiment corresponds to an example of the third pipe connector in the present invention.

The control unit 34 includes, for example, a computer, and manages the controls in the test cell 30. Specifically, as shown in FIG. 15 , the control unit 34 controls a test unit 35, a pressure adjustment unit 36, a temperature adjustment unit 37, a differential pressure adjustment unit 38 and a magnetic field adjustment unit 39. Further, since the control unit 34 also controls the above described conveying robot 33 and the actuators 472 and 484 of the first application unit 40, the control unit 34 is electronically connected to the electrical connectors 309 b of the unit connection part 308.

The test unit 35 includes, for example, a computer, a circuit board for testing, or the like, and is electrically connected to a socket 445 provided in each pressure chamber 43 of the first application unit 40. The test unit 35 supplies electric power to the sensor 90 and acquires an electric signal output from the sensor 90 in a state where a predetermined pressure is applied to the sensor 90 by the pressure chamber 43, and determines whether the sensor 90 is a non-defective product or a defective product on the basis of the electric signal. The test unit 35 may acquire the characteristic of the output of the sensor 90 with respect to the actually applied pressure value on the basis of the electric signal output from the sensor 90.

The pressure adjustment unit 36 is connected to the concave portion 441 of the base portion 44 via the above-mentioned pipe 444 a and the like. The pressure adjustment unit 36 includes, for example, a pressurizing device, a depressurizing device, and a pressure controller. The pressurizing device pressurizes the atmosphere in the sealed space 431 by supplying compressed air into the sealed space 431 (to be described later) of the pressure chamber 43. The depressurizing device is a device for depressurizing the atmosphere in the sealed space 431, and as a specific example, an ejector or a vacuum pump can be exemplified. The pressure controller is provided between the pressurizing device and the pipe connector 309 d and between and the depressurizing device and the pipe connector 309 d, is a device for adjusting the pressurizing amount by the pressurizing device and the depressurizing amount by the depressurizing device, and includes, for example, a regulator. Although not particularly limited, the pressure adjustment unit 36 can regulate the pressure in the pressure chamber 43 in the range of −60 kPa to 800 kPa.

The temperature adjustment unit 37 is a unit for supplying a refrigerant and a hot medium to the heat sinks 443 and 462 of the respective pressure chamber 43 of the first application unit 40 in order to adjust the temperature of the sensor 90. The temperature adjustment unit 37 is capable of adjusting the temperature of the sensor 90 through the heat sinks 443 and 462 in the range of −40° C. to +150° C.

As shown in FIG. 19 , the temperature adjustment unit 37 has heat exchangers 371 and 372, a refrigerant container 373, a hot medium container 374, a pump 375, flow paths 376 a to 376 c, and values 377 a to 377 d.

The heat exchanger 371 has a flow path connected to the refrigerant container 373 and a flow path connected to the heat sinks 443 and 462, and cools the refrigerant to be supplied to the heat sinks 443 and 462 by heat exchange between the flow paths. The heat exchanger 371 and the valves 377 a and 377 c are connected via a flow path 376 a.

The heat exchanger 372 also has a flow path connected to the hot medium container 374 and a flow path connected to the heat sinks 443 and 462, and heats the hot medium to be supplied to the heat sinks 443 and 462 by heat exchange between the flow paths. The heat exchanger 372 and the valves 377 b and 377 d are connected via a flow path 376 b.

The temperature adjustment unit 37 adjusts the flow rate of the refrigerant by the valve 377 a and adjusts the flow rate of the hot medium by the valve 377 b. The valve 377 a is connected to the heat sink 443 via the connectors 309 c and 403 c and the pipe 444 b. The valve 377 b is connected to the heat sink 443 via the connectors 309 c and 403 c and the pipe 444 c. Therefore, the refrigerant and the hot medium whose flow rates are adjusted by the valves 337 a and 377 b are supplied to the heat sink 443 and mixed in the heat sink 443. At this time, by changing the mixing ratio of the refrigerant and the hot medium by the valves 377 a and 377 b, it is possible to adjust the temperature of the mixed liquid in the heat sink 443. The heat of the mixed liquid in the heat sink 443 is transferred to the sensor 90 via the socket 445, thereby the temperature of the sensor 90 is adjusted.

Similarly, the temperature adjustment unit 37 adjusts the flow rate of the refrigerant by the valve 377 c and adjusts the flow rate of the hot medium by the valve 377 d. The valve 377 c is connected to the heat sink 462 via the connectors 309 c and 403 c and the pipe 463 a. The valve 377 d is connected to the heat sink 462 via the connectors 309 c and 403 c and the pipe 463 b. Therefore, the refrigerant and the hot medium whose flow rates are adjusted by the valves 337 c and 377 d are supplied to the heat sink 462, and the refrigerant and the hot medium are mixed in the heat sink 462. At this time, by changing the mixing ratio of the refrigerant and the hot medium by the valves 377 c and 377 d, it is possible to adjust the temperature of the mixed liquid in the heat sink 462. The heat of the mixed liquid in the heat sink 462 is transferred to the sensor 90 via the convex portion 461 of the pusher 6, thereby the temperature of the sensor 90 is adjusted.

The heat sink 443 is connected to the flow path 376 c via the pipe 444 d and the connectors 403 c and 309 c. The heat sink 462 is also connected to the flow path 376 c via the pipe 463 c and the connectors 403 c and 309 c. The mixed liquid discharged from the heat sinks 443 and 462 returns to the heat exchangers 371 and 372 via the flow path 376 c. The pump 375 is provided in the flow path 376 c and pumps the mixed liquid.

In the present embodiment, the refrigerant and the hot medium are supplied to all (a total of eight) heat sinks 443 and 462 of the first application unit 40 by one temperature adjustment unit 37, but this is not particularly limited. For example, the test cell includes the four temperature adjustment units, and one temperature adjustment unit may be configured to supply the refrigerant and the hot medium to the heat sinks 443 and 462 of one first application device 42. Alternatively, the test cell may include two temperature adjustment units, and the refrigerant and the hot medium may be supplied to the four heat sinks 443 by one temperature adjustment unit, and the refrigerant and the hot medium may be supplied to the four heat sinks 462 by the other temperature adjustment unit.

The differential pressure adjustment unit 38 includes two pressure adjustment units 381 and 382 respectively connected to the first and second pressure nozzles 57A and 57B of the second application unit 50 described later. Each of the first and second pressure adjustment units 381 and 382 has the same configuration as that of the pressure adjustment unit 36 described above. The first and second pressure adjustment units 381 and 382 supply pressures of different magnitudes to the first and second pressure nozzles 57A and 57B.

One of the first and second pressure adjustment units 381 or 382 may also be used as the pressure adjustment unit 36. In this case, the number of pipe connectors 309 e for adjusting the differential pressure of the unit connecting part 309 can be reduced.

The magnetic field adjustment unit 39 includes a power supply for supplying a current to the electromagnets 67 of the third application unit 60 described later (refer to FIG. 28 ), and a control unit for controlling the power supply. The control unit can adjust the strength of the magnetic field formed by the electromagnets 67 by controlling the amount of current supplied from the power source to the electromagnets 67.

Hereinafter, the operation of the first application unit 40 will be described with reference to FIGS. 20(a) to 22. FIGS. 20(a) to 21(c) are cross-sectional views (No. 1 to No. 6) showing the operation of the first application unit in the present embodiment, and FIG. 22 is an enlarged view of the XXII portion in FIG. 21(c).

First, the first suction hand 335 (second suction hand 339) of the conveying robot 33 holding the untested sensor 90 is moved above the window 412 a of the lid 412, and the shutter 413 of the dry chamber 41 is moved to open the window 412 a (refer to FIG. 20(a)).

Next, the first suction head 335 (second suction hand 339) of the conveying robot 33 is lowered, and the sensor 90 is placed on the socket 445 provided in the base portion 44 (refer to FIG. 20(b)). In this state, the head portion 45 is retreated from above the base portion 44.

Next, the first suction head 335 (second suction hand 339) of the conveying robot 34 is raised and retreated from the first application unit 40 (refer to FIG. 20(c)). Next, the shutter 413 of the dry chamber 41 is moved to close the window 412 a (see FIG. 21(a)).

Next, the head portion 45 is moved above the base portion 44 by driving the actuator 472 (refer to FIG. 21(b)). Next, the actuator 484 of the pressing mechanism 48 is driven to move the cam plate 481 toward the head portion 45 (refer to FIG. 21(c)). As a result, the cam follower 464 of the pusher 46 rolls along the cam groove 482 of the cam plate 481, and the pusher 46 of the head portion 45 descends.

When the pusher 46 comes into contact with the base portion 44, as shown in FIG. 22 , a sealed space 431 including a concave portion 441 is formed between the pusher 46 and the base portion 44. In this state, the sensor 90 is pressed against the socket 445 by the convex portion 461 of the pusher 46, and is electrically connected to the socket 445.

Next, the sensor 90 is tested. Specifically, first, the temperature of the sensor 90 is adjusted to a predetermined value by supplying a refrigerant and a hot medium from the temperature adjustment unit 37 to the heat sinks 443 and 462 of the base portion 44 and the head portion 45. Next, the pressure adjustment unit 36 adjusts the pressure of the atmosphere in the sealed space 431 to a predetermined value, thereby applying a predetermined value of pressure to the sensor 90. Then, in a state in which the temperature of the sensor 90 is maintained at a predetermined temperature and a predetermined pressure is applied to the sensor 90, the test unit 35 acquires an electric signal output from the sensor 90 via the socket 445, and judges the quality of the sensor 90.

Returning to FIG. 1 , in the sensor test system 1 of the present embodiment, when the sensor 90 is carried from the loader 10 into the test cell group 20, the first test is performed in the first test cell 30A. The first test is, for example, a low pressure test under a low temperature environment. When the test in the test cell 30A is completed, the sensor 90 is conveyed to the next test cell 30B by the moving device 70.

The second test is performed in the test cell 30B. The second test is a test under different conditions from the first test, for example, a high-pressure test under a low temperature environment. When the test in the test cell 30B is completed, the sensor 90 is conveyed to the next test cell 30C by the moving device 70.

A third test is performed in the test cell 30C. The third test is a test under different conditions from the first and second tests, for example, a low pressure test under a high temperature environment. When the test in the test cell 30C is completed, the sensor 90 is conveyed to the final test cell 30D by the moving device 70.

A fourth test is performed in the test cell 30D. The fourth test is a test under different conditions from the first to third tests, for example, a high-pressure test under a high-temperature environment. When the test in the test cell 30D is completed, the sensor 90 is discharged from the test cell group 20 by the unloader 80.

In this manner, by sequentially performing the tests of the sensors 90 by the test cells 30A to 30D, it is possible to execute a plurality of types (four types in this example) of tests, for one sensor 90. The content of the first to fourth tests is not particularly limited to the above.

As described above, the test object of the sensor test system 1 may be a sensor other than a pressure sensor, and in this case, it is necessary to change the application unit of each test cell 30.

For example, when the test object of the sensor test system 1 is a differential pressure sensor, the second application unit 50 shown in FIGS. 23 to 25 is used. When there is a magnetic sensor as a test object of the sensor test system 1, the third application unit 60 shown in FIGS. 26 to 28 is used.

When the test cell 30 is a sensor for detecting a physical quantity other than pressure or magnetic as a test object, an application unit including an application part to which the physical quantity can be applied may be prepared, and a connector corresponding to the application part may be provided in the unit connection part.

FIG. 23 is a perspective view showing a second application unit in the present embodiment, FIG. 24 is a back view showing a connection portion of the second application unit in the present embodiment, and FIG. 25 is a cross-sectional view showing a second application device of the second application unit in the present embodiment.

As shown in FIG. 25 , the differential pressure sensor 91 has two pressure application ports 911 and 912. The differential pressure sensor 91 detects a first pressure through a first pressure application port 911 and detects a second pressure through a second pressure application port 912. The first pressure and the second pressure are pressure values different from each other, and the differential pressure sensor 91 calculates a difference between the first pressure and the second pressure, and outputs an electric signal according to the calculation result.

When the test object of the sensor test system 1 is the differential pressure sensor 91, the second application unit 50 shown in FIG. 23 is used as the application unit for the differential pressure sensor. The second application unit 50 has the same configuration as the above described first application unit 40 except that the first application device 42 is replaced with the second application device 52 and the connection portion 403 is replaced with the connection portion 503.

As shown in FIG. 23 , the second application unit 50 includes a dry chamber 51 and a plurality of (four in this example) second application devices 52. The configuration of the dry chamber 51 is the same as that of the dry chamber 41 of the first application unit 40 described above.

Similarly to the first application unit 40, the second application unit 50 can be moved into and out of the apparatus main body 301 via the opening 306 d. More specifically, by inserting and sliding the support plate 501 supporting the dry chamber 51 between the pair of slide rails 307 of the apparatus main body 301, the second application unit 50 can be set in the apparatus main body 301.

In the present embodiment, as shown in FIG. 24 , a connection portion 503 is provided on the back surface 511 b of the housing 511 of the dry chamber 51. The connection portion 503 includes various connectors 503 a to 503 c and 503 e. The connectors 503 a to 503 c are the same connectors as the connectors 403 a to 403 c of the first application unit 40 respectively, and are arranged at the same positions as the connectors 403 a to 403 c.

The pipe connector 503 e is a pipe connector for adjusting a differential pressure. The pipe connector 503 e is provided so as to correspond to the pipe connector 309 e (see FIG. 17 ) of the unit connecting part 308 of the apparatus main body 301, and can be fitted to the pipe connector 309 e.

As shown in FIGS. 23 and 25 , the second application device 52 includes a base portion 54, a head portion 55, and a pressing mechanism 58. The pressing mechanism 58 has the same configuration as the pressing mechanism 48 of the first application unit 40 described above.

The base portion 54 is fixed to the bottom surface of the housing 511 of the dry chamber 51 so as to face the window 512 a of the lid 512 of the dry chamber 51. A socket 541 is provided on the upper surface of the base portion 54. The socket 541 has the same configuration as the socket 445 described above, and is electrically connected to the electrical connector 503 a.

A heat sink 542 is formed inside the base portion 54. The heat sink 542 has the same configuration as the heat sink 443 described above, and is connected to the temperature adjustment unit 37 via the pipe connectors 503 c and 309 c. The heat sink 542 is provided directly below the socket 541, and can heat/cool the sensor 91 through the socket 541.

The head portion 55 includes a pusher 56, a first pressure nozzle 57, a second pressure nozzle 58, and a holding plate (not shown). The holding plate has the same configuration as that of the holding plate 47 described above, and movably holds the pusher 56 via a stopper and a coil spring, and is movable in the Y direction by an actuator (not shown). The actuator is electrically connected to the electrical connector 503 b.

The first and second pressure nozzles 57A and 57B pass through the pusher 56 and are exposed at the tip of the pusher 56. An O-ring 571 is attached to the tip of the first pressure nozzle 57A, and an O-ring 571 is also attached to the tip of the second pressure nozzle 57B. The first pressure nozzle 57A is connected to the first pressure adjustment unit 381 via the pipe connectors 503 e and 309 e. The second pressure nozzle 57B is also connected to the second pressure adjustment unit 382 via the pipe connectors 503 e and 309 e.

Since the first and second pressure nozzles 57A and 57B are exposed at the center of the distal end surface of the pusher 56, the outer peripheral portion of the distal end surface of the pusher 56 contacts the sensor 91. A heat sink 561 is provided inside the pusher 56. The heat sink 561 has the same configuration as the heat sink 462 described above, and is connected to the temperature adjustment unit 37 via the pipe connectors 503 c and 309 c. Although not shown in particular, the pusher 56 has a cam follower (not shown) having the same configuration as the cam follower 464 described above.

The test of the sensor 91 using the second application unit 50 is performed as follows. That is, when the sensor 91 is placed on the socket 541, the head portion 55 moves horizontally above the sensor 91. Next, the head portion 55 is lowered by the horizontal movement of the pressing mechanism 58, thereby the sensor 91 is pressed against the socket 541 by the pusher 56, and the sensor 91 and the socket 541 are electrically connected to each other. At the same time, the first pressure nozzle 57 is connected to the first pressure application port 911 of the sensor 91, and the second pressure nozzle 58 is connected to the second pressure application port 912 of the sensor 91.

The sensor 91 is then tested. Specifically, first, the temperature of the sensor 91 is adjusted to a predetermined value by supplying a refrigerant and a hot medium from the temperature adjustment unit 37 to the heat sinks 542 and 561 of the base portion 54 and the head portion 55. Next, a first pressure is applied to the first pressure application port 911 of the sensor 91 by the first pressure adjustment unit 381, and a second pressure is applied to the second pressure application port 912 of the sensor 91 by the second pressure adjustment unit 382. Then, the test unit 35 executes the test of the sensor 91 through the socket 541 while maintaining the temperature of the sensor 91 and applying the first and second pressures to the sensor 91.

The first and second pressure nozzles 57A and 57B in the present embodiment correspond to an example of the “differential pressure application part” in the present invention, and the heat sinks 542 and 561 in the present embodiment correspond to an example of the “temperature adjustment part” in the present invention.

FIG. 26 is a perspective view showing a third application unit in the present embodiment, FIG. 27 is a back view showing a connection portion of the third application unit in the present embodiment, and FIG. 28 is a cross-sectional view showing a third application device of the third application unit in the present embodiment.

The magnetic sensor 92 detects the magnitude of the magnetic field applied to the magnetic sensor 92, and outputs an electric signal according to the detection result. The use application of the magnetic sensor 92 is not particularly limited, and is, for example, a current sensor.

When the test object of the sensor test system 1 is the magnetic sensor 92, the third application unit 60 shown in FIG. 26 is used as the application unit for the magnetic sensor. The third application unit 60 has the same configuration as the above described first application unit 40 except that the first application device 42 is replaced with the third application device 62 and the connection portion 403 is replaced with the connection portion 603.

As shown in FIG. 26 , the third application unit 60 includes a dry chamber 61 and a plurality of (four in this example) third application devices 62. The configuration of the dry chamber 61 is the same as that of the dry chamber 41 of the first application unit 40 described above.

Similarly to the first application unit 40, the third application unit 60 can be moved into and out of the apparatus main body 301 via the opening 306 d. More specifically, by inserting and sliding the support plate 601 supporting the dry chamber 61 between the pair of slide rails 307 of the apparatus main body 301, the third application unit 60 can be set in the apparatus main body 301.

In the present embodiment, as shown in FIG. 27 , a connection portion 603 is provided on the back surface 611 b of the housing 611 of the dry chamber 61. The connection portion 603 includes various connectors 603 a to 603 c and 603 f. The connectors 603 a to 603 c are the same connectors as the connectors 403 a to 403 c of the first application unit 40 respectively, and are arranged at the same positions as the connectors 403 a to 403 c.

The electrical connector 603 f is an electrical connector for adjusting a magnetic field. The electrical connector 603 f is provided so as to correspond to the electrical connector 309 f (see FIG. 17 ) of the unit connecting part 308 of the apparatus main body 301, and can be fitted to the electrical connector 309 f.

As shown in FIGS. 26 and 28 , the third application device 62 includes a base portion 64, a head portion 65, a pair of electromagnets 67, and a pressing mechanism 68. The pressing mechanism 68 has the same configuration as the pressing mechanism 48 of the first application unit 40 described above.

The base portion 64 is fixed to the bottom surface of the housing 611 of the dry chamber 61 so as to face the window 612 a of the lid 612 of the dry chamber 61. A socket 641 is provided on the upper surface of the base portion 64. The socket 641 has the same configuration as the socket 445 described above, and is electrically connected to the electrical connector 603 a.

A heat sink 642 is formed inside the base portion 64. The heat sink 642 has the same configuration as the heat sink 443 described above, and is connected to the temperature adjustment unit 37 via the pipe connectors 603 c and 309 c. The heat sink 642 is provided directly below the socket 641, and can heat/cool the magnetic sensor 92 through the socket 641.

The head portion 65 includes a pusher 66 and a holding plate (not shown) for holding the pusher 66. The holding plate has the same configuration as the holding plate 47 described above, and movably holds the pusher 66 via a stopper and a coil spring, and is movable in the Y direction by an actuator (not shown). The actuator is electrically connected to the electrical connector 603 b.

A heat sink 661 is provided inside the pusher 66. The heat sink 661 has the same configuration as the heat sink 462 described above, and is connected to the temperature adjustment unit 37 via the pipe connectors 603 c and 309 c. Although not shown in particular, the pusher 66 has a cam follower (not shown) having the same configuration as the cam follower 464 described above.

The pair of electromagnets 67 are disposed opposite to each other so as to sandwich the sensor 92 being on the socket 641. Each electromagnet 67 has a core 671 and a coil 675.

The core 671 is a ferrite (iron core) for increasing the magnetic flux generated in the coil 675 and allowing a closed loop (magnetic circuit) formed by the magnetic flux to pass through the magnetic sensor 92. The core 671 has a main body 672, a first protrusion 673, and a second protrusion 674. The main body portion 672 is a columnar portion extending along the normal direction (Z direction) of the main surface of the socket 641, and the coil 675 is wound around the main body portion 672. The first projecting portion 673 projects from the upper end of the main body portion 672 toward the first projecting portion 673 of the other electromagnet 67. The magnetic sensor 92 connected to the socket 641 is interposed between the pair of first protrusions 673. The second projecting portion 674 also projects from the lower end of the main body portion 672 toward the second projecting portion 674 of the other electromagnet 67, and the pair of second projecting portions 674 face each other.

The coil 675 is a conductive wire wound around the main body 672 of the core 671, and is connected to the magnetic field adjustment unit 39 via the electrical connectors 603 f and 309 f. When a current flows from the magnetic field adjustment unit 39 to the coil 675, a magnetic flux is generated, and the magnetic flux forms a closed loop such as the main body 671 of one core 671, the first protrusion 672 of one core 671, the magnetic sensor 92, the first protrusion 672 of the other core 671, the main body 671 of the other core 671, the second protrusion 673 of the other core 671, and the second protrusion 672 of the one core 671.

The test of the sensor 92 using the third application unit 60 is performed as follows. That is, when the sensor 92 is placed on the socket 641, the head portion 65 moves above the sensor 92. Next, the head portion 65 is lowered by the horizontal movement of the pressing mechanism 68, thereby the sensor 92 is pressed against the socket 641 by the pusher 66, and the sensor 92 and the socket 641 are electrically connected to each other. At the same time, the sensor 92 is positioned between the first protrusions 673 of the pair of cores 671 facing each other.

The sensor 92 is then tested. Specifically, first, the temperature of the sensor 92 is adjusted to a predetermined value by supplying a refrigerant and a hot medium from the temperature adjustment unit 37 to the heat sinks 642 and 661 of the base portion 64 and the head portion 65. Next, a magnetic field of a predetermined strength is applied to the sensor 92 by the magnetic adjustment unit 39. Then, the test unit 35 executes the test of the sensor 92 through the socket 641 while maintaining the temperature of the sensor 92 and applying a magnetic field to the sensor 92.

The pair of electromagnetic 67 in the present embodiment corresponds to an example of the “magnetic field application part” in the present invention, heat sinks 642 and 661 in the present embodiment corresponds to an example of the “temperature adjustment part” in the present invention.

In the present embodiment, for example, when the pressure sensor 90 is tested by the test cell 30, the first application unit 40 is set in the apparatus main body 301.

Specifically, the first application unit 40 is inserted into the apparatus main body 301 through the opening 306 d of the apparatus main body 301, and the support plate 501 of the first application unit 40 is slid on the slide rails 307 so that the connection portion 403 of the first application unit 40 is connected to the unit connection part 308 of the apparatus main body 301. As a result, the connectors 403 a to 403 d of the first application unit 40 are connected to the connectors 309 a to 309 d of the unit connection part 308 so that a test for the pressure sensor 90 is ready.

On the other hand, when the test object of the test cell 30 is switched from the pressure sensor 90 to the differential pressure sensor 91, the second application unit 50 is set in the apparatus main body 301.

Specifically, first, the first application unit 40 is pulled out from the apparatus main body 301 through the opening 306 d by using the handle 402 of the first application unit 40 set in the apparatus main body 301.

Next, in the same manner as the first application unit 40 described above, the second application unit 50 is inserted into the apparatus main body 301 through the opening 306 d, and the connection portion 503 of the second application unit 50 is connected to the unit connection part 308 of the apparatus main body 301. As a result, the connectors 503 a to 503 c and 503 e of the second application unit 50 are connected to the connectors 309 a to 309 c and 309 e of the unit connection part 308 so that a test for the differential pressure sensor 91 is ready.

When the test object of the test cell 30 is switched from the pressure sensor 90 or the differential pressure sensor 91 to the magnetic sensor 92, the third application unit 60 is set in the apparatus main body 301.

Specifically, first, the first or second application unit 40 or 50 is pulled out from the apparatus main body 301 through the opening 306 d by using the handle of the first or second application unit 40 or 50 set in the apparatus main body 301.

Next, in the same manner as the first application unit 40 described above, the third application unit 60 is inserted into the apparatus main body 301 through the opening 306 d, and the connection portion 603 of the third application unit 60 is connected to the unit connection part 308 of the apparatus main body 301. As a result, the connectors 603 a to 603 c and 603 f of the third application unit 60 are connected to the connectors 309 a to 309 c and 309 f of the unit connection part 308 so that a test for the magnetic sensor 92 is ready.

As described above, in the present embodiment, since the apparatus main body 301 of the test cell 30 has the opening 306 d from which the first application unit 40 can be taken out, the first application unit 30 can be easily replaced with the second or third application unit 50 or 60 for testing different types of sensors 91 or 92, and therefore, a sensor test apparatus excellent in versatility can be provided.

Embodiments heretofore explained are described to facilitate understanding of the present invention and are not described to limit the present invention. It is therefore intended that the elements disclosed in the above embodiments include all design changes and equivalents to fall within the technical scope of the present invention.

For example, the test cell 30 in the embodiment described above deals with three types of application units 40 to 60, but the number of types of application units that the test cell 30 can deal with is not particularly limited thereto.

For example, the sensor testing test apparatus may only deal with the first and second application units 40 and 50. In this case, the unit connection part does not have an electrical connector 309 f for adjusting the magnetic field.

Alternatively, the sensor test apparatus may deal with only the first and third application units 40 and 60. In this case, the unit connection part does not have the pipe connector 309 e for adjusting the differential pressure.

Alternatively, the sensor test apparatus may deal with only the second and third application units 50, 60. In this case, the unit connection part does not have the pipe connector 309 d for pressure adjustment.

EXPLANATIONS OF LETTERS OR NUMERALS

-   -   1 . . . sensor test system     -   30, 30A to 30D . . . test cell     -   301 . . . apparatus main body     -   302 . . . base     -   302 b . . . concave portion     -   305 . . . cover     -   306 a to 306 d . . . opening     -   307 . . . slide rail     -   308 . . . unit connection part     -   308 a . . . board     -   309 a, 309 b . . . electrical connector     -   309 c to 309 e . . . pipe connector     -   309 f, 309 g . . . electrical connector     -   31 . . . preheat part     -   40 . . . first application unit     -   401 . . . support plate     -   403 . . . connection portion     -   403 a, 403 b . . . electrical connector     -   403 c, 403 d . . . pipe connector     -   41 . . . dry chamber     -   42 . . . first application device     -   43 . . . pressure chamber     -   443 . . . heat sink     -   445 . . . socket     -   46 . . . pusher     -   462 . . . heat sink     -   48 . . . pressing mechanism     -   50 . . . second application unit     -   503 . . . connection portion     -   503 a, 503 b . . . electrical connector     -   503 c, 503 e . . . pipe connector     -   52 . . . second application device     -   57A, 57B . . . first and second pressure nozzles     -   60 . . . third application unit     -   603 . . . connection portion     -   603 a, 603 b . . . electrical connector     -   603 c . . . pipe connector     -   603 f . . . electrical connector     -   62 . . . third application device     -   67 . . . electromagnet     -   33 . . . conveying robot     -   90, 90′ . . . pressures sensor     -   91 . . . differential pressure sensor     -   92 . . . magnetic sensor 

The invention claimed is:
 1. A sensor test apparatus which tests a sensor which detects a physical quantity, the sensor test apparatus comprising: a first application unit comprising one or more application devices each including: a socket to which the sensor is electrically connected; and an application part which applies the physical quantity to the sensor, the physical quantity being detected by the sensor; a test unit which tests the sensor via the socket; a conveying device which conveys the sensor into and out of the first application unit; an apparatus main body which houses the first application unit, the test unit and the conveying device; and a unit connection part to which the first application unit is detachably connected and that is connectable to a second application unit, wherein the apparatus main body has a first opening for inserting the first application unit into the apparatus main body and for removing the first application unit out of the apparatus main body.
 2. The sensor test apparatus according to claim 1, further comprising: a pressure adjustment unit that supplies a compressed air, wherein the application part is a pressure application part that comprises a pressure chamber to which the compressed air is supplied by the pressure adjustment unit and that applies a pressure to the sensor, and the second application unit comprises a socket to which the sensor is electrically connected and a differential pressure application part which applies two kinds of pressure to the sensor.
 3. The sensor test apparatus according to claim 2, wherein the unit connection part includes: a first pipe connector to which the pressure application part of the first application unit is connected; a second pipe connector to which the differential pressure application part of the second application unit is connected; and a first electrical connector to which the socket of the first or second application unit is connected.
 4. The sensor test apparatus according to claim 1, further comprising: a pressure adjustment unit that supplies a compressed air, wherein the application part is a pressure application part that comprises a pressure chamber to which the compressed air is supplied by the pressure adjustment unit and that applies a pressure to the sensor, and the second application unit includes a socket to which the sensor is electrically connected and a magnetic field application part which applies a magnetic field to the sensor.
 5. The sensor test apparatus according to claim 4, wherein the unit connection part includes: a first pipe connector to which the pressure application part of the first application unit is connected; a first electrical connector to which the socket of the first or second application unit is connected; and a second electrical connector to which the magnetic field application part of the second application unit is connected.
 6. The sensor test apparatus according to claim 1, wherein the application part is a differential pressure application part which applies two kinds of pressure to the sensor, and the second application unit includes a socket to which the sensor is electrically connected and a magnetic field application part which applies a magnetic field to the sensor.
 7. The sensor test apparatus according to claim 6, wherein the unit connection part includes: a second pipe connector to which the differential pressure application part of the first application unit is connected; a first electrical connector to which the socket of the first or second application unit is connected; and a second electrical connector to which the magnetic field application part of the second application unit is connected.
 8. The sensor test apparatus according to claim 1, wherein each of the one or more application devices further includes a temperature adjustment part which applies a thermal stress to the sensor to adjust the temperature of the sensor.
 9. The sensor test apparatus according to claim 8, wherein the unit connection part includes at least one of a third pipe connector and a third electrical connector to which the temperature adjustment part is connected.
 10. The sensor test apparatus according to claim 1, wherein each of the one or more application devices further includes: a temperature adjustment part which applies a thermal stress to the sensor to adjust the temperature of the sensor; and a pusher which contacts the sensor and presses the sensor against the socket, and the temperature adjustment part is disposed in the pusher.
 11. The sensor test apparatus according to claim 1, wherein the first application unit comprises two or more of the application devices.
 12. The sensor test apparatus according to claim 1, wherein the first application unit is removed out of the apparatus main body through the first opening in a first direction.
 13. The sensor test apparatus according to claim 12, wherein the apparatus main body has a second opening for removing the conveying device out of the apparatus main body in a second direction opposite to the first direction, a third opening through which the sensor is fed to a first position in the sensor test apparatus, and a fourth opening through which the sensor is ejected from a second position in the sensor test apparatus, and the conveying device moves an untested sensor from the first position to the first application unit and moves a tested sensor from the first application unit to the second position.
 14. The sensor test apparatus according to claim 13, wherein, in plan view, the first position, the first application unit and the second position are arranged in a substantially U-shape around the conveying device, the third opening is open in a third direction substantially orthogonal to the first direction and substantially orthogonal to the second direction, and the fourth opening is open in a fourth direction opposite the third direction.
 15. The sensor test apparatus according to claim 13, further comprising: a preheat part which is disposed between the first position and the first application unit and which applies a thermal stress to the sensor before being conveyed into the first application unit; and a heat removal part which is disposed between the first application unit and the second position and which removes a thermal stress from the sensor after being conveyed out of the first application unit, wherein the conveying device moves the untested sensor from the first position to the preheat part, moves the untested sensor from the preheat part to the first application unit, moves the tested sensor from the first application unit to the heat removal part, and moves the tested sensor from the heat removal part to the second position.
 16. A sensor test apparatus which tests a sensor which detects a physical quantity, the sensor test apparatus comprising: a first application unit comprising one or more application devices each including: a socket to which the sensor is electrically connected; and an application part which applies the physical quantity to the sensor; a test unit which tests the sensor via the socket; a conveying device which conveys the sensor into and out of the first application unit; and an apparatus main body which houses the first application unit, the test unit and the conveying device, wherein the apparatus main body has a first opening for inserting the first application unit into the apparatus main body and for removing the first application unit out of the apparatus main body, the first application unit is removed out of the apparatus main body through the first opening in a first direction, and the apparatus main body includes a slide mechanism which slidably holds the first application unit in the first direction. 